西南石油大学学报(自然科学版) ›› 1992, Vol. 14 ›› Issue (4): 15-22.DOI: 10.3863/j.issn.1000-2634.1992.04.003

• 地质勘探 • 上一篇    下一篇

薄层反射频谱随入射角的变化

雷晓 杨凯 叶林   

  1. 西南石油学院勘探系
  • 收稿日期:1992-03-23 修回日期:1900-01-01 出版日期:1992-11-20 发布日期:1992-11-20

CHANGE IN SPECTRUMS OF THIN LAYERS WITH INCIDENT ANGLES

Lei Xiao yang Kai Ye Lin   

  1. Deparlment of Geological Exploration
  • Received:1992-03-23 Revised:1900-01-01 Online:1992-11-20 Published:1992-11-20

摘要:

本文计算了薄层模型上不同入射角对应的反射频谱。本文比较了不同速度比,不同泊松比和不同厚度薄层的频谱响应之后,指出频域具有类似时域的AVO特性,而差异调谐是薄层反射频谱随入射角变化的重要因素,提出用频谱极值和极值频率作为分析频谱随入射角变化的特征参量。

关键词: 频谱, 薄层, 差异调谐, 频谱极值, 极值频率

Abstract:

In this paper we calculated the reflection spectrums corresponding to different incident angles on a thin layer mould, and compared the spectrums which response to different velocity ratios, Poison s ratios and layer thicknesses. We also showed that the AVO characters in frequency domain are similar to those in time domain, and differential tuning is the main factor affecting spectrum-versus-offset. We proposed that we should use spectrum extremum and extremun frequency as characteristic parameters in spectrum-versus一offset

Key words: Spectrum, Thin layer, Differential tunfng, Spectrum extremum, Extremum frequency

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